08:43 uur 22-01-2021

JEOL: introductie van een nieuwe cryo-elektronenmicroscoop met koude veldemissie CRYO ARM™ 300 II (JEM-3300)

TOKYO– (BUSINESS WIRE) – JEOL Ltd. (TOKYO: 6951) (President & COO Izumi Oi) kondigt de introductie aan van een nieuwe cryo-elektronenmicroscoop met koude veldemissie (cryo-EM), de CRYO ARM ™ 300 II (JEM- 3300), dat in januari 2021 zal worden uitgebracht. Deze nieuwe cryo-EM is ontwikkeld op basis van het concept van “Snel en eenvoudig te bedienen en afbeeldingen met hoog contrast en hoge resolutie te krijgen”.

Ontwikkeling achtergrond

De recente dramatische verbetering van de resolutie bij analyse van afzonderlijke deeltjes (SPA) met behulp van cryo-EM heeft geleid tot SPA als een essentiële methode voor structurele analyse van eiwitten. Om deze markt aan te pakken, heeft JEOL in 2017 de CRYO ARM ™ 300 uitgebracht. Uitgerust met een cold field-emissiepistool (Cold FEG) voor verbeterde resolutie en een cryo-stage voor het laden van meerdere monsters, heeft de CRYO ARM ™ 300 de beste resultaten behaald. in-class resolutie voor SPA.

JEOL: Release of a New Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)

TOKYO–(BUSINESS WIRE)– JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announces the release of a new cold field emission cryo-electron microscope (cryo-EM), the CRYO ARM™ 300 II (JEM-3300), to be released in January 2021. This new cryo-EM has been developed based on the concept of “Quick and easy to operate and get high-contrast and high-resolution images”.

This press release features multimedia. View the full release here: https://www.businesswire.com/news/home/20210121005316/en/

Cold Field Emission Cryo-Electron Microscope CRYO ARM(TM) 300 II (JEM-3300) (Photo: Business Wire)

Development Background

Recent dramatic improvement of resolution in single particle analysis (SPA) using cryo-EM has led to SPA as an essential method for structural analysis of proteins. To address this market, JEOL released the CRYO ARM™ 300 in 2017. Equipped with a cold field emission gun (Cold FEG) for enhanced resolution and a cryo-stage for loading multiple samples, the CRYO ARM™ 300 has continued to achieve best-in-class resolution for SPA.

However, the previous workflow of SPA using cryo-EM needs multiple electron microscopes because the workflows for sample screening and for image data acquisition are independent of one another. This problem gives rise to large operating costs for cryo-EM users. Since multiple microscopes must be used, it is inconvenient to transfer cryo-samples between the cryo-EMs. Therefore, users have been requesting one cryo-EM enabling the complete workflow from sample screening to image data acquisition. Furthermore, in order for various users to use the cryo-EM, an improvement of usability has been required, allowing anyone from novice users to professional users to smoothly operate the microscope.

To meet these requests, JEOL has developed a new cryo-EM, the CRYO ARM™ 300 II. This microscope achieves a great improvement in throughput for high-quality data acquisition with quick and easy operation compared with the previous CRYO ARM™ 300.

Main Features

1. High-speed imaging achieved by optimal electron beam control

2. Improved hardware stability for high-quality image acquisition

3. Higher operability through system improvement

Annual unit sales target

10 units/year

Cold Field Emission Cryo-Electron Microscope CRYO ARM™ 300 II (JEM-3300)

https://www.jeol.co.jp/en/products/detail/JEM-3300.html

JEOL Ltd.

3-1-2, Musashino, Akishima, Tokyo, 196-8558, Japan

Izumi Oi, President & COO

(Stock code: 6951, Tokyo Stock Exchange First Section)